Single Event Effects in Aerospace

  • Filename: single-event-effects-in-aerospace.
  • ISBN: 9780470767498
  • Release Date: 2011-01-05
  • Number of pages: 380
  • Author: Edward Petersen
  • Publisher: John Wiley & Sons



This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Extreme Environment Electronics

  • Filename: extreme-environment-electronics.
  • ISBN: 9781439874318
  • Release Date: 2012-11-26
  • Number of pages: 1041
  • Author: John D. Cressler
  • Publisher: CRC Press



Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Radiation Effects in Semiconductors

  • Filename: radiation-effects-in-semiconductors.
  • ISBN: 1439826951
  • Release Date: 2010-08-19
  • Number of pages: 431
  • Author: Krzysztof Iniewski
  • Publisher: CRC Press



Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.

FPGAs and Parallel Architectures for Aerospace Applications

  • Filename: fpgas-and-parallel-architectures-for-aerospace-applications.
  • ISBN: 3319143514
  • Release Date: 2015-12-15
  • Number of pages: 325
  • Author: Fernanda Kastensmidt
  • Publisher: Springer



This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Soft Errors in Modern Electronic Systems

  • Filename: soft-errors-in-modern-electronic-systems.
  • ISBN: 1441969934
  • Release Date: 2010-09-24
  • Number of pages: 318
  • Author: Michael Nicolaidis
  • Publisher: Springer Science & Business Media



This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Proceedings of the 2011 2nd International Congress on Computer Applications and Computational Science

  • Filename: proceedings-of-the-2011-2nd-international-congress-on-computer-applications-and-computational-science.
  • ISBN: 9783642283086
  • Release Date: 2012-02-23
  • Number of pages: 516
  • Author: Ford Lumban Gaol
  • Publisher: Springer Science & Business Media



The latest inventions in computer technology influence most of human daily activities. In the near future, there is tendency that all of aspect of human life will be dependent on computer applications. In manufacturing, robotics and automation have become vital for high quality products. In education, the model of teaching and learning is focusing more on electronic media than traditional ones. Issues related to energy savings and environment is becoming critical. Computational Science should enhance the quality of human life, not only solve their problems. Computational Science should help humans to make wise decisions by presenting choices and their possible consequences. Computational Science should help us make sense of observations, understand natural language, plan and reason with extensive background knowledge. Intelligence with wisdom is perhaps an ultimate goal for human-oriented science. This book is a compilation of some recent research findings in computer application and computational science. This book provides state-of-the-art accounts in Computer Control and Robotics, Computers in Education and Learning Technologies, Computer Networks and Data Communications, Data Mining and Data Engineering, Energy and Power Systems, Intelligent Systems and Autonomous Agents, Internet and Web Systems, Scientific Computing and Modeling, Signal, Image and Multimedia Processing, and Software Engineering.

Electro Static Discharge

  • Filename: electro-static-discharge.
  • ISBN: 9781118211076
  • Release Date: 2011-09-20
  • Number of pages: 320
  • Author: Michel Mardiguian
  • Publisher: John Wiley & Sons



A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as "the most thorough and concise treatment of the broad ESD continuum that is available." Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover: Effects of ESD coupled to electronics Principal ESD specifications ESD diagnostics and testing Design for ESD immunity To help with troubleshooting, many ESD case histories are given along with their successful fixes. Electrostatic Discharge is essential reading for all designers who want to avoid component failures, no trouble found incidents, and random errors.

FinFETs and Other Multi Gate Transistors

  • Filename: finfets-and-other-multi-gate-transistors.
  • ISBN: 9780387717517
  • Release Date: 2008
  • Number of pages: 339
  • Author: J.-P. Colinge
  • Publisher: Springer Science & Business Media



FinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications of multigate field-effect transistors (FETs). It explains the physics and properties of these devices, how they are fabricated and how circuit designers can use them to improve the performances of integrated circuits. The International Technology Roadmap for Semiconductors (ITRS) recognizes the importance of these devices and places them in the "Advanced non-classical CMOS devices" category. Of all the existing multigate devices, the FinFET is the most widely known. FinFETs and Other Multi-Gate Transistors is dedicated to the different facets of multigate FET technology and is written by leading experts in the field.

Spacecraft Systems Engineering

  • Filename: spacecraft-systems-engineering.
  • ISBN: 9781119978367
  • Release Date: 2011-08-24
  • Number of pages: 752
  • Author: Peter Fortescue
  • Publisher: John Wiley & Sons



This fourth edition of the bestselling Spacecraft Systems Engineering title provides the reader with comprehensive coverage of the design of spacecraft and the implementation of space missions, across a wide spectrum of space applications and space science. The text has been thoroughly revised and updated, with each chapter authored by a recognized expert in the field. Three chapters – Ground Segment, Product Assurance and Spacecraft System Engineering – have been rewritten, and the topic of Assembly, Integration and Verification has been introduced as a new chapter, filling a gap in previous editions. This edition addresses ‘front-end system-level issues’ such as environment, mission analysis and system engineering, but also progresses to a detailed examination of subsystem elements which represents the core of spacecraft design. This includes mechanical, electrical and thermal aspects, as well as propulsion and control. This quantitative treatment is supplemented by an emphasis on the interactions between elements, which deeply influences the process of spacecraft design. Adopted on courses worldwide, Spacecraft Systems Engineering is already widely respected by students, researchers and practising engineers in the space engineering sector. It provides a valuable resource for practitioners in a wide spectrum of disciplines, including system and subsystem engineers, spacecraft equipment designers, spacecraft operators, space scientists and those involved in related sectors such as space insurance. In summary, this is an outstanding resource for aerospace engineering students, and all those involved in the technical aspects of design and engineering in the space sector.

Formal Techniques for Safety Critical Systems

  • Filename: formal-techniques-for-safety-critical-systems.
  • ISBN: 9783319054162
  • Release Date: 2014-04-05
  • Number of pages: 297
  • Author: Cyrille Artho
  • Publisher: Springer



This book constitutes the refereed proceedings of the Second International Workshop, FTSCS 2013, held in Queenstown, New Zealand, in October 2013. The 17 revised full papers presented together with an invited talk were carefully reviewed and selected from 32 submissions. The papers address various topics related to the application of formal and semi-formal methods to improve the quality of safety-critical computer systems.

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