Single Event Effects in Aerospace

  • Filename: single-event-effects-in-aerospace.
  • ISBN: 9781118084311
  • Release Date: 2011-11-16
  • Number of pages: 448
  • Author: Edward Petersen
  • Publisher: John Wiley & Sons



This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Single Event Effects in Aerospace

  • Filename: single-event-effects-in-aerospace.
  • ISBN: 9780470767498
  • Release Date: 2011-01-05
  • Number of pages: 380
  • Author: Edward Petersen
  • Publisher: John Wiley & Sons



This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.

Reliability and Radiation Effects in Compound Semiconductors

  • Filename: reliability-and-radiation-effects-in-compound-semiconductors.
  • ISBN: 9789814277112
  • Release Date: 2010
  • Number of pages: 376
  • Author: Allan Johnston
  • Publisher: World Scientific



This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

FPGAs and Parallel Architectures for Aerospace Applications

  • Filename: fpgas-and-parallel-architectures-for-aerospace-applications.
  • ISBN: 9783319143521
  • Release Date: 2015-12-07
  • Number of pages: 325
  • Author: Fernanda Kastensmidt
  • Publisher: Springer



This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Extreme Environment Electronics

  • Filename: extreme-environment-electronics.
  • ISBN: 9781439874301
  • Release Date: 2012-11-26
  • Number of pages: 1041
  • Author: John D. Cressler
  • Publisher: CRC Press



Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space. The Definitive Guide to Extreme Environment Electronics Featuring contributions by some of the world’s foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics. Continuing beyond just the "paper design" of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material. With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.

Soft Errors in Modern Electronic Systems

  • Filename: soft-errors-in-modern-electronic-systems.
  • ISBN: 1441969934
  • Release Date: 2010-09-24
  • Number of pages: 318
  • Author: Michael Nicolaidis
  • Publisher: Springer Science & Business Media



This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Spacecraft Systems Engineering

  • Filename: spacecraft-systems-engineering.
  • ISBN: 9781119978367
  • Release Date: 2011-08-24
  • Number of pages: 752
  • Author: Peter Fortescue
  • Publisher: John Wiley & Sons



This fourth edition of the bestselling Spacecraft Systems Engineering title provides the reader with comprehensive coverage of the design of spacecraft and the implementation of space missions, across a wide spectrum of space applications and space science. The text has been thoroughly revised and updated, with each chapter authored by a recognized expert in the field. Three chapters – Ground Segment, Product Assurance and Spacecraft System Engineering – have been rewritten, and the topic of Assembly, Integration and Verification has been introduced as a new chapter, filling a gap in previous editions. This edition addresses ‘front-end system-level issues’ such as environment, mission analysis and system engineering, but also progresses to a detailed examination of subsystem elements which represents the core of spacecraft design. This includes mechanical, electrical and thermal aspects, as well as propulsion and control. This quantitative treatment is supplemented by an emphasis on the interactions between elements, which deeply influences the process of spacecraft design. Adopted on courses worldwide, Spacecraft Systems Engineering is already widely respected by students, researchers and practising engineers in the space engineering sector. It provides a valuable resource for practitioners in a wide spectrum of disciplines, including system and subsystem engineers, spacecraft equipment designers, spacecraft operators, space scientists and those involved in related sectors such as space insurance. In summary, this is an outstanding resource for aerospace engineering students, and all those involved in the technical aspects of design and engineering in the space sector.

Electro Static Discharge

  • Filename: electro-static-discharge.
  • ISBN: 9781118211076
  • Release Date: 2011-09-20
  • Number of pages: 320
  • Author: Michel Mardiguian
  • Publisher: John Wiley & Sons



A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as "the most thorough and concise treatment of the broad ESD continuum that is available." Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover: Effects of ESD coupled to electronics Principal ESD specifications ESD diagnostics and testing Design for ESD immunity To help with troubleshooting, many ESD case histories are given along with their successful fixes. Electrostatic Discharge is essential reading for all designers who want to avoid component failures, no trouble found incidents, and random errors.

FinFETs and Other Multi Gate Transistors

  • Filename: finfets-and-other-multi-gate-transistors.
  • ISBN: 9780387717517
  • Release Date: 2008
  • Number of pages: 339
  • Author: J.-P. Colinge
  • Publisher: Springer Science & Business Media



FinFETs and Other Multi-Gate Transistors provides a comprehensive description of the physics, technology and circuit applications of multigate field-effect transistors (FETs). It explains the physics and properties of these devices, how they are fabricated and how circuit designers can use them to improve the performances of integrated circuits. The International Technology Roadmap for Semiconductors (ITRS) recognizes the importance of these devices and places them in the "Advanced non-classical CMOS devices" category. Of all the existing multigate devices, the FinFET is the most widely known. FinFETs and Other Multi-Gate Transistors is dedicated to the different facets of multigate FET technology and is written by leading experts in the field.

Proceedings of the 2011 2nd International Congress on Computer Applications and Computational Science

  • Filename: proceedings-of-the-2011-2nd-international-congress-on-computer-applications-and-computational-science.
  • ISBN: 9783642283086
  • Release Date: 2012-02-23
  • Number of pages: 516
  • Author: Ford Lumban Gaol
  • Publisher: Springer Science & Business Media



The latest inventions in computer technology influence most of human daily activities. In the near future, there is tendency that all of aspect of human life will be dependent on computer applications. In manufacturing, robotics and automation have become vital for high quality products. In education, the model of teaching and learning is focusing more on electronic media than traditional ones. Issues related to energy savings and environment is becoming critical. Computational Science should enhance the quality of human life, not only solve their problems. Computational Science should help humans to make wise decisions by presenting choices and their possible consequences. Computational Science should help us make sense of observations, understand natural language, plan and reason with extensive background knowledge. Intelligence with wisdom is perhaps an ultimate goal for human-oriented science. This book is a compilation of some recent research findings in computer application and computational science. This book provides state-of-the-art accounts in Computer Control and Robotics, Computers in Education and Learning Technologies, Computer Networks and Data Communications, Data Mining and Data Engineering, Energy and Power Systems, Intelligent Systems and Autonomous Agents, Internet and Web Systems, Scientific Computing and Modeling, Signal, Image and Multimedia Processing, and Software Engineering.

Brilliant Blunders

  • Filename: brilliant-blunders.
  • ISBN: 9781439192382
  • Release Date: 2013-05-14
  • Number of pages: 352
  • Author: Mario Livio
  • Publisher: Simon and Schuster



Drawing on the lives of five great scientists, this “scholarly, insightful, and beautifully written book” (Martin Rees, author of From Here to Infinity) illuminates the path to scientific discovery. Charles Darwin, William Thomson (Lord Kelvin), Linus Pauling, Fred Hoyle, and Albert Einstein all made groundbreaking contributions to their fields—but each also stumbled badly. Darwin’s theory of natural selection shouldn’t have worked, according to the prevailing beliefs of his time. Lord Kelvin gravely miscalculated the age of the earth. Linus Pauling, the world’s premier chemist, constructed an erroneous model for DNA in his haste to beat the competition to publication. Astrophysicist Fred Hoyle dismissed the idea of a “Big Bang” origin to the universe (ironically, the caustic name he gave to this event endured long after his erroneous objections were disproven). And Albert Einstein speculated incorrectly about the forces of the universe—and that speculation opened the door to brilliant conceptual leaps. As Mario Livio luminously explains in this “thoughtful meditation on the course of science itself” (The New York Times Book Review), these five scientists expanded our knowledge of life on earth, the evolution of the earth, and the evolution of the universe, despite and because of their errors. “Thoughtful, well-researched, and beautifully written” (The Washington Post), Brilliant Blunders is a wonderfully insightful examination of the psychology of five fascinating scientists—and the mistakes as well as the achievements that made them famous.

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